Transmission electron microscope (TEM) with 200 kV accelerating voltage and LaB6 electron gun, and with scanning transmission electron mode (STEM). The microscope will be equipped with energy-dispersive X-ray micoanalysator (EDS) for measuring the chemical composition of materials in micro volumes. This equipment enables implementation of experimental technique known as analytical transmission electron microscopy. This technique is fundamental for studying the materials mikrostructure in the micro and nano scale regions. It facilitates the understanding of rules which obey the effect taking place in materials, crucial for their application potentials. The acquired knowledge will be used to improve the properties of materials already in use and for innovation and novel materials preparation.
Basic technical parameters of the equipment are:
- minimal point resolution 0.28 nm
- minimal line resolutioní 0.15 nm
- spherical abberation (max.) 1.4 mm
- chromatic abberation (max.) 1.8 mm
- magnification range at least 50 – 800 000 times
- STEM mode
. - EDS analyzer with light elements (C, N, O) detection ability.
Research group:
Advanced Metallic Materials and Metal Based Composites
