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Ion polisher Fischione TEM Mill 1050

Name:	Ion polisher Fischione TEM Mill 1050
Location:	CEITEC Brno University of Technology
Instrument description:	Machine for creating thin electron transparent specimens for TEM. TEM Mill incorporates two independently adjustable ion sources, liquid nitrogen specimen cooling, automatic gas control, and a vacuum system for ultra-clean specimen processing. The specimen holder accommodates double-sided milling to 0° without specimen shadowing. Tilt angles are adjustable in the range from –10° to +10°. In addition to full specimen rotation with ion beam sequencing, the programmable rocking angle control is available. The TEM Mill includes a microscope with CCD camera for better specimen viewing and polishing process control.
Research group:	CF: CEITEC Nano

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