Events Calendar

Search for the specific conference, workshop or lecture ...

Semi-automated 4-probe system Cascade Microtech SUMMIT 12000

Name:	Semi-automated 4-probe system Cascade Microtech SUMMIT 12000
Technology / Methodology:	Electrical & Magnetic measurements
Location:	CEITEC Brno University of Technology
Instrument description:	SUMMIT Semi-automated probe station is precise on-wafer device and process characterization system. This test instruments allows measuring of semiconductor structures on wafers up to 200mm diameter. System is designed for RF/Microwave application, device characterization, wafer level reliability and special e-tests. Probe system has EMI shielding for low noise measurement, DC, RF mmW, FA, WLR and more configurations of measuring.
Research group:	CF: CEITEC Nano

More CEITEC News ...

29. ledna 2018 9:46

LECTURE: Dr. Ondrej Hovorka: Models of magnetic nanoparticles for biomedical applications

25. ledna 2018 18:21

WHEN: 30. 01. 2018 WHERE: CEITEC BUT, Purkynova 123, large meeting room SPEAKER: Dr Andriy Marko TALK: Advances in PELDOR…